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Agilent 4155B Semiconductor Parameter Analyzer – Precision Measurement for Advanced Applications

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The Agilent 4155B Semiconductor Parameter Analyzer is designed for comprehensive electrical characterization of semiconductor devices, offering high precision and reliability across various applications including research, development, and production testing.

Measurement Range:Current: ±100nA to ±10mA Voltage: ±20mV to ±20V

Measurement Accuracy:+/-0.05% of reading + 1 digit

Sampling Rate:Up to 10 readings per second

Display:2-line, 16-character LCD

Power Supply:100-240V AC, 50/60Hz

Dimensions:13.5 x 21.5 x 5.5 cm (W x H x D)

Weight:1.5 kg

    High Precision Measurement: The Agilent 4155B provides accurate and reliable measurements, ensuring precision in semiconductor characterization.

    Comprehensive Testing Capabilities: Supports a wide range of tests including I-V, C-V, and pulsed I-V measurements, making it suitable for a variety of applications.

    User-Friendly Interface: Features an intuitive interface with a 5.7-inch TFT LCD display, making operation straightforward and efficient.

    Versatile Connectivity: Equipped with RS-232, GPIB, and USB interfaces, enabling seamless integration with existing systems and facilitating easy data transfer.

    Reliable Construction: Built with high-quality materials, the Agilent 4155B is designed for durability and long-term use in demanding environments.

Agilent 4155B

Agilent 4155B

Agilent 4155B




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